Development of x-ray powder diffraction and x-ray fluorescent techniques using synchrotron radiation

Abstract

This thesis presents analytical techniques developed for the synchrotron radiation at the Siam Photon Laboratory, Synchrotron Light Research Institute (Public Organization). In this thesis, x-rays from synchrotron has been used in order to improve the resolution and enhance the process of measurement. The design and development of synchrotron beamline for x-ray powder diffraction under high pressure condition, x-ray absorption spectroscopy and x-ray fluorescent techniques will be presented. This research emphasizes on the methods of x-ray powder diffraction and x-ray fluorescent techniques used for samples characterization. For the x-ray fluorescence apparatus, the characteristic x-rays from the sample are stimulated by a white light synchrotron x-ray beam and the fluorescence data were collected using a Si-PIN detector. Furthermore, polycapillary x-ray half lens is a powerful tool that used for focusing polychromatic x-rays in x-ray fluorescent imaging technique and also for focusing and increasing photon flux of monochromatic x-rays in x-ray powder diffraction technique under high pressure condition. In addition, necessary x-ray fluorescent data analysis software for the quantitative analysis of the composite materials will also be expressed.